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Numerical Analysis of Time Resolved Photoluminescence for Alumina/Cd(Se,Te) Double Heterostructures

机译:氧化铝/镉(SE,TE)双异质结构的时间分辨率分辨率分辨的光致发光

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Al2O3 has demonstrated excellent Cd(Se,Te) surface passivation. In this work, recombination mechanisms were investigated by comparing simulations of time resolved photoluminescence (TRPL) to PL decay data (320 ns effective lifetime) for Al2O3/Cd(Se,Te)/Al2O3 double heterostructures. Models were employed to investigate the effects of bulk and surface recombination, electric fields, mobility, and doping by simulating intensity-dependent single- (1PE) and two-photon excitation (2PE) TRPL. 2PE simulations replicate decay behavior while 1PE simulations require attention to charge redistribution. Various coupled mechanisms cannot be distinguished from PL decay data alone. Complementary measurements are required to constrain the model parameters and isolate mechanisms.
机译:AL. 2 O. 3 已经证明了优异的CD(SE,TE)表面钝化。在这项工作中,通过将时间分辨的光致发光(TRPL)的模拟与AL的PL衰减数据(320ns有效寿命)进行比较来研究重组机制 2 O. 3 / cd(se,te)/ al 2 O. 3 双重异性结构。使用模型来研究通过模拟依赖于依赖的单(1PE)和双光子激发(2PE)TRPL来研究体积和表面重组,电场,电场,迁移率和掺杂的影响。 2PE仿真复制衰减行为,而1PE仿真需要注意充电再分配。单独的PL衰减数据不能区分各种耦合机制。需要互补的测量来限制模型参数和隔离机制。

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