Visual Inspection of Free Form Glossy Surfaces using Phase Shifted Deflectometry

摘要

This form of phase shifted deflectometry provides a unique solution to enhancing the capabilities of the visual inspection process. Being able to set objective threshold limits to not only track changes in surface structures but also in gloss levels on free form specular surfaces can greatly increase the consistency and quality that is expected from the visual inspection process. Surfaces that require detailed inspection and high quality control from cosmetic to functional can greatly benefit from this technique. Additionally, manufacturing processes could be optimized based on consistent and reliable feedback of an automated system.