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A Lightweight Method for Accelerating Discovery of Taint-Style Vulnerabilities in Embedded Systems

机译:一种轻量级方法,用于加速嵌入式系统中的污染漏洞的发现

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Nowadays, embedded systems have been widely deployed in numerous applications. Firmwares in embedded systems are typically custom-built to provide a set of very specialized functionalities. They are prone to taint-style vulnerability with a high probability, but traditional whole-program analysis has low efficiency in discovering the vulnerability. In this paper, we propose a two-stage mechanism to accelerate discovery of taint-style vulnerabilities in embedded firmware: first recognizing protocol parsers that are prone to taint-style vulnerabilities from firmware, and then constructing program dependence graph for security-sensitive sinks to analyze their input source. We conduct a real-world experiment to verify the mechanism. The result indicates that the mechanism can help find taint-style vulnerabilities in less time compared with whole-program analysis.
机译:如今,嵌入式系统已广泛部署在许多应用中。嵌入式系统中的Firmwares通常是定制的,以提供一组非常专业的功能。它们易于具有高概率的污染脆弱性,但传统的全程分析在发现脆弱性方面具有低效率。在本文中,我们提出了一种两阶段机制,可以加速发现嵌入式固件中的Tainty漏洞:首先识别出于固件的Taint-Sixt漏洞,然后构建用于安全性敏感沉积的程序依赖性图表分析他们的输入源。我们进行真实世界的实验来验证机制。结果表明,与全程分析相比,该机制可以在更短的时间内帮助找到污染漏洞。

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