Green's function methods; crystal defects; field effect transistors; graphene devices; microwave transistors; nanoribbons; semiconductor device models; Armchair GNR; C; GNR-FET; NEGF-based simulation; Stone-Wales defects; analog operational frequency; digital electronics; edge roughness; electronic properties; field effect transistors; graphene nanoribbon; nanoscale devices; nonequilibrium Green's function; tunable bandgap; Cutoff frequency; Field effect transistors; Graphene; Logic gates; Materials; Performance evaluation; Photonic band gap; Armchair GNR; Edge Roughness; GNR-FET; NEGF; Stone-Wales Defects;
机译:石材 - 威尔士缺陷和粗糙度对金表面润滑性润滑性的影响
机译:带有Stone-Wales缺陷的锯齿形石墨烯纳米带边缘重建
机译:具有Stone-Wales缺陷的锯齿形边缘石墨烯纳米带的电子和磁性
机译:石纹缺陷和边缘粗糙度对石墨烯纳米带FET的开关和频率性能的影响
机译:延长石墨烯的缺陷
机译:Stone-Wales缺陷对石墨烯碳纳米管和尼龙6之间的界面相互作用的作用:第一性原理研究
机译:Zigzag石墨烯纳米带边缘重建与stone-Wales缺陷