首页> 外文会议>CPES annual power electronics conference >Analytical Core Loss Models for Planar Inductors with Non-uniform Flux Distribution and Non- sinusoidal Excitation
【24h】

Analytical Core Loss Models for Planar Inductors with Non-uniform Flux Distribution and Non- sinusoidal Excitation

机译:非均匀磁通分布和非正弦激励的平面电感器的分析铁损模型

获取原文

摘要

In today's state-of-the-art designs, bulky magnetic components pose major barriers to integrate a DC/DC converter into a single chip. One of the promising technologies to integrate the magnetic component with the active component is three-dimensional (3D) integration, using a low-profile inductor as the substrate. In order to optimize low-profile inductor design for high-frequency applications, the core loss of a low-profile inductor should be modeled. However, most low-profile planar inductors have very non-uniform flux distribution. Therefore, previous core loss models, which are based on uniform flux distribution, cannot be used. In addition to non-uniform flux distribution, some planar inductors, such as low-temperature co-fired ceramics (LTCC) inductors, also have non-linear permeability, which makes modeling the core loss for planar inductors even more unconventional and complicated. This paper proposes some analytical core loss models for different low-profile planar inductor structures with non-uniform flux distributions and non-linear permeability. These analytical models also consider non-sinusoidal excitations and the impact of dc bias on core loss. Based on LTCC technology, several low-profile planar inductors are fabricated to help verify these core loss models, and the measured core loss closely match the predicted results, which means the proposed analytical core loss models have very good accuracy.
机译:在当今最先进的设计中,笨重的磁性元件构成了将DC / DC转换器集成到单个芯片中的主要障碍。将磁性元件与有源元件集成在一起的有前途的技术之一是使用低剖面电感器作为衬底的三维(3D)集成。为了针对高频应用优化薄型电感器设计,应对薄型电感器的铁损进行建模。但是,大多数低剖面平面电感器的通量分布非常不均匀。因此,不能使用基于均匀通量分布的先前铁损模型。除了通量分布不均匀外,某些平面电感器(例如低温共烧陶瓷(LTCC)电感器)还具有非线性磁导率,这使得对平面电感器的铁损进行建模变得更加不常规和复杂。本文针对具有不均匀磁通分布和非线性磁导率的不同低剖面平面电感器结构,提出了一些分析铁芯损耗模型。这些分析模型还考虑了非正弦激励以及直流偏置对铁损的影响。基于LTCC技术,制造了几种低剖面平面电感器来帮助验证这些铁损模型,并且测得的铁损与预测结果非常吻合,这意味着所提出的分析铁损模型具有非常好的准确性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号