Model Based Error Correction for Optical Aberrations in Laser Scanning Microscopes

摘要

In this article the use of an error correction strategy for optical aberrations based on ray-tracing is proposed and theoretically and experimentally validated using a laser scanning microscope of our own design. The system, its modelling and its calibration are briefly introduced together with experimental results. A comparison between the proposed error correction and one based on an artifact pre-measuring are also shown.