Test Framework Generation for Model-Based Testing in Embedded Systems

摘要

Model Driven Development (MDD) and Model-Based Testing (MBT) are slowly replacing the traditional methods of developing and testing real-time embedded software systems (RTESS). However, even though MBT finds wide applicability in various fields, none of the existing approaches deals with generating test artifacts for deploying MBT in the RTESS. This paper discusses an algorithm for test framework generation and deploying online MBT in RTESS. A novel test framework generation algorithm is introduced which, given the design model (representing the requirements of an RTESS) and a System Under Test (SUT), generates a test framework which comprises of the necessary artifacts to perform MBT in RTESS. The discussed approach eliminates the need for dynamic source code instrumentation for executing the test stimuli in the embedded target. A prototype implementation of the test framework generation algorithm is discussed along with an illustrative example. An empirical comparison between the existing and the proposed approach is provided.