首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >DEVELOPMENT OF ELECTROCONDUCTIVE COPPER PASTES FOR HETEROJUNCTION SOLAR CELL ELECTRODE MATERIALS
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DEVELOPMENT OF ELECTROCONDUCTIVE COPPER PASTES FOR HETEROJUNCTION SOLAR CELL ELECTRODE MATERIALS

机译:用于异质结太阳能电池电极材料的导电铜浆料的开发

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We developed copper pastes containing a low melting point alloy for heterojunction solar cell electrode wiring materials. Characteristics reside in that facts that 65 μm-wide line printing is possible and that a low melting point alloy is melted at 180°C or lower and alloys with copper, thereby possessing a low line resistance value and a low contact resistance value. We confirmed that our copper pastes have line resistance and contact resistance of the same degrees as those of Ag pastes under curing conditions of 180°C or lower for heterojunction solar cells. Also, we confirmed the state that a low melting point alloy is melted through SEM cross-sectional observation of the cross section. By achieving alloying, an improvement of humidity resistance is also contrived, and an increase ratio of the line resistance at 85°C and 85% RH for 1,000 hours is less than 30%. It is already reported that copper ions do not diffuse into a silicon wafer upon alloying. This suggests that the cell conversion efficiency does not become worse even with a lapse of time. Also, we report results of studies regarding the printability which has been of a problem so far. We contrived to renovate screen printing technologies and confirmed that 65 μm-wide lines can be printed. There was no problem in the continuous printability, and results in which a change of viscosity at every number of times of printing is small were revealed. Thus, we may consider that our developed copper pastes are on an industrially practically useful level.
机译:我们开发了含有低熔点合金的铜浆料,用于异质结太阳能电池电极布线材料。特性存在于可能的情况下,具有65μm宽的线路印刷的事实,并且低熔点合金在180℃或更低的用铜的合金中熔化,具有低线电阻值和低接触电阻值。我们确认我们的铜浆料具有与效应于180°C或更低的固化条件下的抗浆料相同程度的线性阻力和接触电阻。此外,我们确认了低熔点合金通过横截面的SEM横截面观察熔化的状态。通过实现合金化,还具有湿度抗性的提高,并且85℃和85%RH的线电阻的增加率少于30%。已经报道了铜离子在合金化上不扩散到硅晶片中。这表明即使流逝的时间,电池转换效率也不会变得更糟。此外,我们报告了到目前为止存在问题的印刷性的研究结果。我们编辑以翻新丝网印刷技术,并确认可以打印65μm宽的线路。在连续的可打印性中没有问题,并且揭示了每次印刷次数下的粘度变化的结果。因此,我们可能认为我们的发达的铜浆是在工业上实际上有用的水平。

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