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Testability of Cryptographic Hardware and Detection of Hardware Trojans

机译:加密硬件的可测试性和硬件木马的检测

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Cryptographic algorithms are routinely used toper form computationally intense operations over increasingly larger volumes of data, and in order to meet the high throughput requirements of the applications, are often implemented by VLSI designs. The high complexity of such implementations raises concern about their reliability. In order to improve upon the testability of sequential circuits, both at fabrication time and also in the field, Design For Testability (DFT) techniques are commonly employed. However conventional DFT methodologies for digital circuits have been found to compromise the security of the cryptographic hardware. In this tutorial we first discuss the challenges and potential attacks on cipher hardware through standard DFT techniques, and then potential solutions against them. Also, as the electronic design industry has grown globally, economic reasons dictate the widespread participation of external agents in modern design and manufacture of integrated circuits(ICs), which decreases the control that the IC design houses used to traditionally have over their own designs. This issue raises the question of ensuring Trust in an integrated circuit, and whether the IC can be certified to be free of malicious, hard-to detect circuitry, commonly referred to as Hardware Trojans. In this tutorial, we would explore the unique challenges and testing solutions to detect/prevent such malicious modifications.
机译:VLSI设计通常使用加密算法来对越来越大的数据量执行计算密集型操作,并且为了满足应用程序的高吞吐量要求。这种实现方式的高度复杂性引起了人们对其可靠性的关注。为了在制造时以及在现场都改善顺序电路的可测试性,通常采用可测试性设计(DFT)技术。然而,已经发现用于数字电路的常规DFT方法损害了加密硬件的安全性。在本教程中,我们首先讨论通过标准DFT技术对密码硬件提出的挑战和潜在的攻击,然后针对这些挑战提出潜在的解决方案。另外,随着电子设计行业在全球范围内的发展,经济原因决定了外部代理商广泛参与现代设计和制造集成电路(IC),这降低了IC设计公司传统上对自己的设计所拥有的控制权。这个问题引起了一个问题,即要确保集成电路中的可信度,以及是否可以证明该IC是否不含恶意的,难以检测的电路(通常称为硬件木马),这是一个问题。在本教程中,我们将探索独特的挑战和测试解决方案以检测/防止此类恶意修改。

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