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Reliability practices for satellite design and assembly focusing on FMECA, cleanliness and X-ray inspection

机译:卫星设计和组装的可靠性实践,重点是FMECA,清洁度和X射线检查

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Because most space systems are extremely complex, and need to service long enough under extreme environmental conditions, it is necessary to perform, execute, and provide a method of risk identification during the design stage. The Failure Modes Effects and Criticality Analysis, FMECA has been recognized as such an effective approach that provides the necessary visibility during the design period by identifying mission critical failure modes and provides an input for design alteration. Besides design improvement tools, the manufacturing and inspection procedures of space application products like satellite need to take care special attention. The cleanliness requirements of soldering and assembly areas should be supplied to avoid the occurrence of failure mechanisms caused by contaminants like particulates; such as dirt, sand, industrial fumes, hair cosmetics, dead human skin cells, fibers and lint from clothing, chips and burrs from machined surfaces and etc. As a sophisticated inspection tool, X-ray is particularly beneficial for the evaluation of solder joints and assemblies that involve advanced packaging technologies such as: Ball grid array (BGA), land grid array (LGA), chip size package (CSP), flip chip (FC), wafer level packaging (WLP), system in package (SIP) and quad flat-pack no leads (QFN) etc. The use of X-ray inspection is forced by the standards for space application products BGA solder joints. The defects can be detected by X-ray inspection are; shorts, voiding, delamination, missing part, open, misalignment, warpage, counterfeit components etc.
机译:由于大多数空间系统极其复杂,并且需要在极端环境条件下提供足够长的使用寿命,因此有必要在设计阶段执行,执行并提供一种风险识别方法。 FMECA的“故障模式影响和临界度分析”被认为是一种有效的方法,它可以通过识别关键的故障模式来在设计期间提供必要的可见性,并为设计变更提供输入。除了设计改进工具外,卫星等太空应用产品的制造和检查程序也需要特别注意。应提供对焊接和装配区域的清洁度要求,以避免发生由微粒等污染物引起的失效机理;例如污垢,沙子,工业烟气,头发化妆品,人的死皮细胞,衣服上的纤维和皮棉,加工表面上的碎屑和毛刺等。作为一种先进的检查工具,X射线对评估焊点特别有用。以及涉及先进封装技术的组件,例如:球栅阵列(BGA),焊盘栅格阵列(LGA),芯片尺寸封装(CSP),倒装芯片(FC),晶圆级封装(WLP),系统级封装(SIP)太空应用产品BGA焊点的标准要求使用X射线检查。缺陷可以通过X射线检查发现;短裤,空隙,分层,零件缺失,打开,未对准,翘曲,假冒组件等。

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