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High Mobility Oxide Semiconductor TFT for Circuit Integration of AM-OLED

机译:用于AM-OLED电路集成的高迁移率氧化物半导体TFT

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We have developed a high mobility and high reliability oxide semiconductor TFT which used ITZO as a channel material. The mobility was 30.9 cm2A/s and the threshold voltage shifts after 20,000 sec of BTS test was smaller than 0.1 V. In addition, we have developed a method of getting a stable enhancement type TFT, which realizes circuit integration for AM-OLED.
机译:我们已经开发出使用ITZO作为沟道材料的高迁移率和高可靠性的氧化物半导体TFT。迁移率为30.9 cm2A / s,BTS测试20,000秒后的阈值电压漂移小于0.1V。此外,我们开发了一种获得稳定的增强型TFT的方法,该方法可实现AM-OLED的电路集成。

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