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IMPROVED CRACK GROWTH CORRECTION FOR RESISTANCE CURVE DETERMINATION

机译:改进的裂纹增长校正,可确定电阻曲线

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Resistance curves (J-integral vs. crack growth) are commonly generated by measuring load, deformation (crack-mouth opening displacement or load-line displacement), and crack length (by unloading compliance or some other technique) during testing of a pre-cracked specimen. The J-integral calculated from the work done must then be corrected for crack growth. A method has been described in the literature, and incorporated into test standards, to do this using deformation plasticity theory. However, the commonly-used equations include an approximation that is valid for small increments of crack growth, introducing an uncertainty that increases with the increment size. In the present work, a much better approximation is described that essentially removes the sensitivity to increment size, and applied to results of single-edge tension SE(T) fracture toughness tests.
机译:电阻曲线(J积分与裂纹扩展)通常是通过在测试预测试期间测量载荷,变形(裂纹口张开位移或载荷线位移)和裂纹长度(通过卸载顺应性或其他技术)来生成的。破裂的标本。然后必须对完成的工作计算出的J积分进行裂纹扩展校正。文献中已经描述了一种方法,该方法已结合到测试标准中,使用变形可塑性理论来实现。但是,常用的方程式包括一个近似值,该近似值对于裂纹扩展的小增量有效,从而引入了不确定性,该不确定性随扩展大小的增加而增加。在当前的工作中,描述了一种更好的近似值,该近似值基本上消除了对增量大小的敏感性,并应用于单边拉伸SE(T)断裂韧性测试的结果。

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