首页> 外文会议>24th International Symposium on Discharges and Electrical Insulation in Vacuum >Change of dielectric strength of vacuum interrupters in process of life-time degradation
【24h】

Change of dielectric strength of vacuum interrupters in process of life-time degradation

机译:真空灭弧室寿命下降过程中介电强度的变化

获取原文

摘要

60 kV vacuum interrupters (VI) for 110 kV circuit-breakers are investigated. Reduction of dielectric strength of VI in process of expiration of an electric resource is revealed at lightning pulse test. It occurs owing to reduction of dielectric strength of system “case-shield” owing to metallization of a part of an internal insulation surface of VI case with products of contact erosion. Metallization increases with reduction of switching resource. Dielectric strength of an inter-contact gap with its sufficient length does not provide dielectric strength of VI. The original shielding system providing preservation of dielectric strength of VI up to expiration of an electric resource is developed and offered.
机译:研究了用于110 kV断路器的60 kV真空灭弧室(VI)。在雷电脉冲试验中发现了在电力耗尽过程中VI的介电强度降低。这是由于VI外壳的内部绝缘表面的一部分因接触腐蚀产物金属化而降低了系统“外壳屏蔽”的介电强度而导致的。金属化随着交换资源的减少而增加。接触间隙的足够长的介电强度不能提供VI的介电强度。开发并提供了一种原始屏蔽系统,该屏蔽系统可以保护VI的介电强度直至电力耗尽。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号