Combining High Resolution Pulsed TIVA and nanoprobing techniques to identify drive strength issues in mixed signal circuits

摘要

This paper uses an interesting case study to highlight High Resolution Pulsed TIVA with Solid Immersion Lens (SIL) as a technique to isolate a temperature sensitive failure in a mixed signal circuitry followed by circuit analysis and Nanoprobing to confirm a drive strength issue caused by a process change.