Electrochemical Characterization of Micro-Patterned La_(0,6)Sr_(0,4)Co_(0,2)Fe_(0,8)O_3Thin Film Structures on Fused Silica

摘要

The polarization resistance of solid oxide fuel cell (SOFC)cathodes strongly depends on the structure of the cathodeelectrolyteinterface. Therefore measurements of the polarizationresistance of cathode thin films on electrolyte thin films arerequired in order to predict the performance of thin film SOFCs. Inthis study La_(0,6)Sr_(0,4)Co_(0,2)Fe_(0,8)O_3 (LSCF) thin films were depositedby pulsed laser deposition on fused silica wafers carrying prestructuredPt/Ta electrodes and a (Y_2O_3)_(0.08)(ZrO_2)_(0.92) (YSZ) thinfilm. Photolithography and argon sputtering were used to fabricatemicro-patterns which proved to be applicable for the simultaneouscharacterization of LSCF thin films with respect to electrical inplaneand cross-plane conductivity as well as polarizationresistance. In the future such test platforms are destined for thecharacterization of different cathode thin films with respect toconduction and oxygen reduction properties.