首页> 外文会议>9th International Conference on Solid-State and Integrated-Circuit Technology(第9届固态和集成电路国际会议)论文集 >Study on the Quadrature Error under Varying Ambient Pressure for a Bulk Micromachined Z-axis Gyroscope
【24h】

Study on the Quadrature Error under Varying Ambient Pressure for a Bulk Micromachined Z-axis Gyroscope

机译:大体积微加工Z轴陀螺仪在变化环境压力下的正交误差研究

获取原文

摘要

This paper focused on the study of the quadrature error for a bulk micromachined gyroscope under varying pressure conditions between 150Pa and 100kPa. The source of the quadrature error and the non-ideal model of the micromachined gyroscope are presented with details. The change trend and characterization of pressure dependence were analyzed both analytically and experimentally in the custom-built installation. The results indicated that in order to meet high resolution and stabilization of the quadrature error,the optimal working pressure applied to the gyroscope must limit to a certain boundary condition. At last,some effective methods of restraining the quadrature error were put forward.
机译:本文重点研究了在150Pa和100kPa之间变化的压力条件下,整体微机械陀螺仪的正交误差。详细介绍了微机械陀螺仪的正交误差来源和非理想模型。在定制安装中,通过分析和实验分析了压力依赖性的变化趋势和特征。结果表明,为了满足高分辨率和正交误差的稳定要求,施加在陀螺仪上的最佳工作压力必须限制在一定的边界条件下。最后提出了抑制正交误差的有效方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号