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Experimental model of aging mechanisms of on-load tap changer contacts

机译:有载分接开关触头老化机理的实验模型

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It is known that most failure of power transformers are related to aging effects of the on-load tap changer contacts. To understand the aging mechanisms and to develop knowledge rules to interpret different failure mechanisms a test model has been developed. In particular, the effect of the several aging stages of tap changer change-over selector contacts on dynamic resistance measurements (DRM) has been considered, by several measurements with aged tap changer contacts. These aging phases include clean contacts, contacts with an oil film layer, contacts with coking and contacts with pitting. Based on these experiments it is shown that the DRM method is very sensitive to aged change-over selector contacts of an on-load tap changer.In addition to laboratory experiments, the same measurements are performed on naturally aged change-over selector contacts at a Dutch utility.
机译:众所周知,大多数电力变压器故障都与有载分接开关触头的老化效应有关。为了了解老化机制并开发知识规则以解释不同的故障机制,已经开发了测试模型。尤其是,通过对已老化的分接开关触点进行多次测量,已考虑到分接开关转换选择器触点的几个老化阶段对动态电阻测量(DRM)的影响。这些老化阶段包括干净的接触,与油膜层的接触,与焦化的接触和与点蚀的接触。根据这些实验表明,DRM方法对有载分接开关的老化转换选择器触点非常敏感。除实验室实验外,在自然条件下对自然老化的转换选择器触点进行了相同的测量。荷兰实用程序。

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