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EFFECT OF RECOMBINATION ON ULTRASHORT PULSE LASER MATERIAL REMOVALBY COULOMB EXPLOSION

机译:重组对库仑爆炸去除超短脉冲激光材料的影响

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The femtosecond laser material interaction takes placeon a very short time scale. The transfer of energy fromthe pul pulse to the material cannot be described usingse thermal concepts as these are based on a time scalewhich is much longer than that during femtosecondpulse interaction. Therefore the femtosecond pulsemay be considered as an intense electromagnetic wave.When a ultra short laser pulse impinges asemiconductor, the atoms are ionized by two processesmainly multiphoton ionization and impact ionization.These processes are responsible for exciting theelectrons from the valence band to the conductionband. We als also study how collisional absorption ofo photons affects the ionization rate and bring out itssignificance. As the atoms are ionized the cohesiveenergy which binds them together becomes very small,the intermolecular bonds between nuclei are weakenedand th the positively charged nuclei repel each other. Ase the substrate is ionized by each laser pulse, thecohesive energy decreases and the material ablationresults due to Coulomb explosion which is thehypothesis for this study. As they are repelled, theelectr electrons that were excited from the valence band toons the conduction band show a tendency to recombinewith the holes created in the valence band. Thisprocess is called recombination. For very high carrierdensities generated by ultra short pulses the primaryre recombination mechanism is called Augercombination recombination. The recombination mechanism causesthe repulsion between atoms to reduce and our purposeis to try and understand how much of an effect therecombination mechanism has on the ablation rate andhence the expansion of the ablation zone. In this paperwe present a model for the ionization processes andhence solve for the ionization rate at the end of thepulse. As the material expands the electrons are assumed to move with it and hence this process can beaptly described by the 1 ptly 1-D convection equation withrecombination. This convection equation is solvedalong with the Euler equations and the ionization rateis used as the initial condition to predict expansionvelocity, pressure and the temperature in the ablationzone.
机译:飞秒激光材料发生相互作用 在很短的时间范围内。能量转移 无法使用以下方法描述对材料的脉冲脉冲 这些热概念是基于时间尺度的 比飞秒更长 脉冲相互作用。因此飞秒脉冲 可能被认为是强烈的电磁波。 当超短激光脉冲撞击 半导体,原子通过两个过程被电离 主要是多光子电离和碰撞电离。 这些过程负责激发 电子从价带到传导 乐队。我们还将研究碰撞吸收如何 光子影响电离速率并带出电离速率 意义。当原子被离子化时,内聚力 将它们束缚在一起的能量变得很小, 原子核之间的分子间键被削弱 带正电的原子核互相排斥。作为 如果基板被每个激光脉冲电离, 内聚能降低,材料烧蚀 库仑爆炸的结果是 这项研究的假设。当他们被击退时, 从价带激发到的电子 导带显示出重组的趋势 在价带上产生孔。这 该过程称为重组。对于非常高的载体 超短脉冲产生的密度 重组机制称为俄歇 组合重组。重组机制导致 减少原子之间的排斥力和我们的目的 试图去了解有多大的影响 重组机制对烧蚀率有影响 因此扩大了消融区。在本文中 我们提出了电离过程的模型 因此在结束时求解电离率 脉冲。随着材料的膨胀,假定电子与之一起移动,因此该过程可以 用1 pt一维对流方程恰当地描述 重组。对流方程求解 连同欧拉方程和电离速率 用作预测扩张的初始条件 烧蚀中的速度,压力和温度 区。

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