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THE USE OF ULTRASONIC IMAGING FOR NON-DESTRUCTIVE EVALUATION OF RADIATION DAMAGE TO DIELECTRIC OPTICAL COATINGS

机译:超声成像在电光涂层辐射损伤无损评估中的应用

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Certain space borne optical system designs require that dielectric coated lenses be exposedto the energetic electrons and protons associated with the space environment. The dielectriccoating can charge to a potential that causes electrostatic discharge to occur within thecoating layers. This can cause melting and re-crystallization of a portion of the coating andlens, but the damage may not be apparent in a visual or microscope inspection if the lens isintended for use with light outside of the visible wavelength range. Inspecting the lens with amicroscope that operates in the wavelength range for which the lens is designed is alsodifficult, because the specular surface of the lens makes it difficult to know when themicroscope is focused at the depth where damage will be found. Experiments wereconducted with an ultrasonic imaging system to find out if this technique is useful fordetecting radiation-induced damage within a lens. The experimental technique provedsuccessful. The ultrasonic microscope selects a portion of the echo signal that is defined tobe within a specific time interval after the echo from the front surface of the coating, and usesthat measurement to paint one pixel in an overall inspection picture of the lens. By using atransducer with a frequency appropriate to the thickness of the reflective coating, andexamining the trailing edge portion of the echo signal reflected from the depth of the coatinglensinterface, it was possible to form an image that revealed the electrostatic dischargedamage. This made it possible to characterize the radiation damage with a non-destructivetest, to see how total dose and energy affect the amount of damage, and to correlate thedamage with the optical properties of the lens.
机译:某些星载光学系统设计要求暴露电介质涂层的透镜 与空间环境相关的高能电子和质子。电介质 涂层可能会充电到导致静电放电发生的电位 涂层。这可能导致部分涂层熔化和重结晶,并且 镜头,但如果在镜头或显微镜下检查,则损坏可能在目视或显微镜检查中不明显 适用于可见波长范围以外的光。检查镜头 还可以在设计镜头的波长范围内操作的显微镜 之所以困难,是因为镜片的镜面表面使我们很难知道何时 显微镜聚焦在会发现损坏的深度。实验是 用超声成像系统进行检查,以确定该技术是否对 检测镜头内由辐射引起的损坏。实验技术证明 成功的。超声波显微镜选择回波信号的一部分,该部分被定义为 在涂层前表面回波之后的特定时间间隔内,并使用 该测量可以在镜头的整体检查图片中绘制一个像素。通过使用 频率适合反射涂层厚度的换能器,以及 检查从镀膜透镜的深度反射的回波信号的后缘部分 界面,可以形成显示静电放电的图像 损害。这样就可以用非破坏性的特征来表征辐射损伤 测试,以了解总剂量和能量如何影响损伤程度,并关联 损坏镜片的光学性能。

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