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LOW NOISE CRYOGENIC IF AMPLIFIERS FOR SUPER HETERODYNE RADIO ASTRONOMY RECEIVERS

机译:超杂波无线电天文接收器的低噪声低温中频放大器

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As part of Onsala Space Observatory instrumentation activities, a 3.4-4.6 GHz and a 4-8 GHz cryogenic low-noise amplifiers were developed. These amplifiers will be used as cold IF amplifier for mm and sub-mm wave receivers with SIS and HEB mixer (Onsala 7 channel 3mm array and APEX projects). The 2-stage 3.4-4.6 GHz amplifier was fabricated in 7 copies with consistently very similar performance at 12 K ambient temperature as follows: gain 28 dB with 2.8 K noise temperature using Mitsubishi MGFC4419G GaAs transistor, and 2.2 K noise when tested with Chalmers InP transistor at the first stage. The 2-stage 4-8 GHz LNA demonstrates 25 dB gain with noise temperature of 5.0 K with GaAs transistors, 4.0 K with Chalmers InP transistor at the input stage. These performances are in a very good agreement with simulations and are believed to be among the best-reported using GaAs transistors. The amplifiers design was carried using Agilent ADS, HFSS and Momentum CAD software. The amplifier input circuitry was measured separately and optimised for the best noise performance, while special care was taken about accurate modelling of passive components, bond wires and having accurate S parameters at cryogenic temperature for the transistor. In this paper we present details on the amplifier design, performances (modelled and measured) and also gain-stability comparison between GaAs and InP transistor based amplifiers.
机译:作为Onsala空间天文台仪器活动的一部分,开发了3.4-4.6 GHz和4-8 GHz低温低噪声放大器。这些放大器将用作带有SIS和HEB混频器(Onsala 7通道3mm阵列和APEX项目)的毫米波和亚毫米波接收器的冷IF放大器。 2级3.4-4.6 GHz放大器以7个副本制造,在12 K环境温度下具有始终非常相似的性能,如下所示:使用三菱MGFC4419G GaAs晶体管在2.8 K噪声温度下增益28 dB,并在用Chalmers InP测试时获得2.2 K噪声晶体管在第一阶段。 2级4-8 GHz LNA在GaAs晶体管的噪声温度为5.0 K的情况下展示了25 dB的增益,在输入级使用Chalmers InP晶体管的噪声温度为4.0K。这些性能与仿真非常吻合,并被认为是使用GaAs晶体管报道得最好的。放大器的设计使用Agilent ADS,HFSS和Momentum CAD软件进行。放大器的输入电路经过单独测量并针对最佳噪声性能进行了优化,同时特别注意无源元件,键合线的精确建模以及在晶体管的低温下具有准确的S参数。在本文中,我们介绍了有关放大器设计,性能(建模和测量)以及基于GaAs和InP晶体管的放大器之间的增益稳定性比较的详细信息。

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