Magnetic Field Dependence of Critical Current Density of NbTi Thin Films as a Parameter of Angle

摘要

As a parameter of magnetic field angle with respect to the film plane of a NbTi sample, the relationship between critical current density J_c and the field is investigated experimentally. The J_c values of the thin films having thicknesses of 26nm, 50nm, and 120nm are measured at various angles, changing the strength of the magnetic field up to 7T at 4.2K. It is found that the decrease of J_c affected by the field is suppressed by increasing the thickness of the films irrespective of the angle. The influence of angle on the magnetic field strength dependence of J_c for various thicknesses is also discussed.