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MICROSTRUCTURAL CHARACTERIZATION OF Au-DOPED IRON OXIDE FOR CO GAS SENSORS

机译:用于CO气体的金掺杂氧化铁的微观结构表征。

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A detailed characterization by XRD, SEM, TEM, Mossbauer and XPS of a series of Au-doped iron oxide with different gold loading is reported. It has shown that the morphology and microstructure of samples containing Au is different from that of the undoped oxide. The formation of iron oxide amorphous phases is favored at higher gold loading. Au was found to be distributed in the structure of the semiconductor oxide mainly in an oxidized state, irrespectively of the metal loading.On the basis of the reported results, the role of Au in modifying the microstructure of the doped materials and its effect on the CO sensing at low temperature are discussed.
机译:据报道,用XRD,SEM,TEM,Mossbauer和XPS对一系列金含量不同的金掺杂氧化铁进行了详细表征。结果表明,含金的样品的形态和微观结构与未掺杂的氧化物不同。高载金量有利于氧化铁非晶相的形成。发现Au主要以氧化态分布在半导体氧化物的结构中,而与金属负载无关。 根据报道的结果,讨论了金在修饰掺杂材料的微观结构中的作用及其对低温下CO感测的影响。

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