Optical interferometric techniques provide high spatial resolution images of modal patterns. That could be an advantage with respect to Broad Band Techniques since the use of a high number of measuring points can be avoided. In this paper are presented the results obtained on a microsatellite sandwich structure using an Electronic Speckle Pattern Interferometry (ESPI) system with enhanced capabilities for modal pattern analysis. The modal shapes are compared with the ones experimentally obtained by FRFs. The ESPI system is based on a PCI bus frame grabber with on board processing capability and image processing routine specifically developed.
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