Surface analysis of molecular contamination on selected long duration exposure facility tray surfaces

摘要

A detailed surface analysis using ESCA, sputter depth profiling, and imaging techniques has been carried out for selected areas of trays A4 (trailing edge), C6 (side), and E10 (leading edge) from the Long Duration exposure Facility (LDEF). Surfaces near vent openings in the thermal control blankets on each of these trays were examined for silicon content.