SURFACE MICROSTRUCTURAL CHARACTERIZATION BY ATOMIC FORCE MICROSCOPY (AFM) AND SEM OF GLASS-CERAMICS OBTAINED FROM GEOTHERMAL SILICA WASTE

摘要

From geothermal silica waste has been obtained original glasses in commercial compositions. Several of these glass-ceramics from the cordierite, feldspars, nepheline and spodumene system have been microstructurally characterized by SEM/EDX and AFM ( Atomic Force Microscopy ) in order to evaluate the differences between surface and bulk crystallization. Otherwise, the effect of crystallization on surface roughness can be studied by the high atomic resolution of AFM. This microstructure characterization has allowed to investigate the relation between surface texture and mechanical properties, such as abrasion resistance and microhardness.