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Novel negative resists using thermally stable crosslinkers based on phenolic compounds

机译:使用基于酚类化合物的热稳定交联剂的新型负性抗蚀剂

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Abstract: This is a preliminary report on a family of crosslinkers based on phenolic compounds for negative-working photoresists which are suitable for KrF excimer laser exposure using poly(hydroxystyrene) (PHS) as a base resin. The crosslinkers are benzylic derivatives having etherificated or esterificated phenolic hydroxyl group. Several effects upon the resist performances of chemically amplified (CA) resist systems comprising onium salt, PHS, and the crosslinkers are mainly discussed: i.e., sort of substituent, sort of mother molecular structure, sort of crosslinkable group, baking conditions, PHS's molecular weight, additives, and so on. The CA resist gives quarter-micron line and space pairs without swelling using a KrF excimer laser exposure. Moreover, in this report another effective method for inhibiting the swelling is proposed. Finally, a unique negative resist, which is not a CA resist, is also presented. It gives negative-tone images by thermal crosslinking reaction following photo-induced dissociation of the protective group of crosslinker. !13
机译:摘要:这是有关用于负性光致抗蚀剂的基于酚类化合物的交联剂系列的初步报告,这些交联剂适用于以聚(羟基苯乙烯)(PHS)为基础树脂的KrF准分子激光曝光。交联剂是具有醚化或酯化的酚羟基的苄基衍生物。主要讨论了对包含鎓盐,PHS和交联剂的化学放大(CA)抗蚀剂系统的抗蚀剂性能的几个影响:即取代基的种类,母体分子结构的种类,可交联基团的种类,烘烤条件,PHS的分子量,添加剂等。使用KrF受激准分子激光曝光,CA抗蚀剂可形成四分之一微米的线和空间对,而不会膨胀。此外,在该报告中,提出了另一种抑制肿胀的有效方法。最后,还介绍了一种非CA抗蚀剂的独特负性抗蚀剂。通过光致交联剂保护基的离解,通过热交联反应可得到负图像。 !13

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