首页> 外文会议>Solid State Device Research Conference, 1993. ESSDERC '93 >First demonstration of nanosecond photon timing in the near-infrared with InGaAs/InP detectors
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First demonstration of nanosecond photon timing in the near-infrared with InGaAs/InP detectors

机译:InGaAs / InP检测器在近红外中首次演示纳秒光子定时

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摘要

We show that SAGM InGaAs/InP Avalanche Photodiodes, cooled at 200K, detect the arrival time of single photons with nanosecond resolution. Hole trapping at the heterointerface impairs the performance of presently available devices. However, a proper design of the structure for low temperature operation is expected to improve their timing performance well below the nanosecond limit.
机译:我们显示,冷却至200K的SAGM InGaAs / InP雪崩光电二极管检测到纳秒分辨率的单个光子的到达时间。异质接口处的空穴陷阱会损害当前可用设备的性能。但是,针对低温操作的结构的适当设计可望改善其计时性能,使其远低于纳秒级极限。

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