The basic principles of operation of atomic force microscopy (AFM), and the image formation mechanisms are discussed. In contact mode AFM the tip/sample interaction used to generate the image and to regulate the feedback loop is based on the deformation of the cantilever pressed against the sample. In tapping mode AFM this role is played by the flow of vibration energy from the piezoelectrically driven, vibrated cantilever into the sample. Superimposed on the significantly more pronounced tip/sample convolution effects than in the case of scanning tunneling microscopy, the two different kinds of interaction may generate different kinds of artifacts (compression of the tube, "snakeing", etc.) The milestones of the AFM investigation of carbon nanotubes will be reviewed.
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