首页> 外文会议>European conference on applied superconductivity;EUCAS 1999 >Measurements of losses in bulk Bi-2223 plate carrying dc transport currents exposed to an alternating field
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Measurements of losses in bulk Bi-2223 plate carrying dc transport currents exposed to an alternating field

机译:Bi-2223散装板的损耗测量,该板携带暴露于交变场的直流传输电流

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A high critical current Bi-2223 plate has been successfully manufactured. This paper discusses the hysteresis llosses arising in the plate exposed to an ac field with dc transport currents. The loss components of the sample have been derived using the V-I curves of the sample. It is shown that the losses of the smaple are of the same order as the estimations for II_co and HH_p. It is also confirmed that a field applied normal to the sample causes higher losses than that applied parallel to the sample.
机译:高临界电流Bi-2223板已成功制造。本文讨论了在具有直流传输电流的交流场中暴露于极板上的磁滞损耗。样品的损耗成分已使用样品的V-I曲线得出。结果表明,smaple的损耗与I << I_co和H >> H_p的估计值的阶数相同。还证实了,垂直于样品施加的磁场比平行于样品施加的磁场引起更高的损耗。

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