Automated crystal orientation measurement (ACOM) in the scanning electron microscope (SEM) is a standard technique of texture analysis (pattern recognition) that is used in materials science. The measurement is carried out by interpreting backscatter Kikuchi patterns, in particular by the extraction of the position of so-called Kikuchi bands, I.e. pairs of parallel lines. Their detection strongly depends on appropriate processing of a source image, which usually is highly corrupted by noise and has uneven background illumination. Such advanced processing is addressed in this paper. It exploits wavelet transform based de-noising as well as curve modification and curvelet transform based contrast enhancement methods. Additionally, directional, ridge detection type 2D filters are used for searching lines missing to pairs.
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