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Proficiency Testing of Instruments - a Key Element for Quality Assurance in X-Ray Powder Diffraction Part 1: Matching the Effort to the Actual Needs

机译:仪器的能力测试-X射线粉末衍射质量保证的关键要素第1部分:使工作与实际需求相匹配

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Certified reference materials (CRM), phosphor grade CaF_2 micron powder and a finegrained indialite powder synthesized at BAM were used for proficiency testing of an X-ray powder diffraction instrument which is operated in Bragg-Brentano geometry and equipped with stepper motor driven variable slit systems both for the aperture and for the anti-scatter slits. Relative intensity corretion functions (ICF's) were determined for a wide range of diffraction angles (10 deg - 140 deg ) with estimated standard deviations (esd's) smaller 1percnet. For two direct--dependant deviations of the integrated intensities of diffraction lines from the simple sindirect--law were detected. It is concluded that regular monitoring of the refined temperature factors or of the ICF's measured on standard samples should be part of proficiency testing of XRPD instruments used in connection with Rietveld refinements.
机译:经认证的参考材料(CRM),磷光体级CaF_2微米粉末和在BAM合成的细粉状辉绿岩粉末用于X射线粉末衍射仪的能力测试,该仪器以Bragg-Brentano几何形状运行,并配有步进电机驱动的可变狭缝系统无论是光圈还是防散射狭缝。在较宽的衍射角范围(10度至140度)中确定了相对强度校正函数(ICF),估计的标准偏差(esd's)小于1percnet。对于衍射线的积分强度与简单正正定律的两个直接相关的偏差进行了检测。结论是,定期监测精制温度因子或在标准样品上测得的ICF应作为Rietveld精制所使用的XRPD仪器能力测试的一部分。

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