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Obtaining high Q resonant circuits for dielectric measurements by means of a regenerative amplifier

机译:通过再生放大器获得用于介电测量的高Q谐振电路

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Power factor measurements by resonant circuit techniques are limited by losses in the resonant circuit. Essentially the methods in use measure the loss, or Q of the circuit under the two conditions: (a) dielectric sample in the circuit and (b) sample out. Sample losses are obtained by the difference of the two measurements, and in the case of polystyrene and similar low loss dielectrics at radio frequencies (1-100 mcps) the difference is a small fraction of the directly measured losses.
机译:通过谐振电路技术进行的功率因数测量受到谐振电路损耗的限制。本质上,所使用的方法在以下两个条件下测量电路的损耗或Q:(a)电路中的介电样品和(b)采样出。样品损耗是通过两次测量的差值获得的,对于聚苯乙烯和类似的低损耗电介质,在射频(1-100 mcps)的情况下,该差值是直接测量的损耗的一小部分。

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