Electrical stress distribution in high voltage DC solid dielectric cables

摘要

Insulation resistivity was measured as a function of temperature and electrical stress on slabs of solid dielectric. These data were empirically fitted to a resistivity equation using a time-sharing computer. The transcendental stress equation is then solved for each dielectric using a computer program written for this purpose. Parameters which affect stress distribution are temperature, electrical stress, voltage, cable geometry, and time of electrification.