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CdTe detector characteristics around 30掳C when using the periodic bias reset technique

机译:使用周期性偏置复位技术时,CdTe检测器的特性在30掳C附近

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Pulse heights of the CdTe detector photopeaks were lowered in several ten minutes due to the polarization effect around 30degC. In this paper, the CdTe detector characteristics were evaluated at 30degC and 35degC, and the periodic bias reset technique was investigated as a way to stabilize the detector performance. The 500 V bias with 0.5 s to 60s reset durations and 1 min to 20 min reset intervals was applied to 1 mm thick CdTe detectors. It was found that the 0.5 s reset duration and 5 min reset interval was able to stabilize the detector performance at 35degC.
机译:由于30摄氏度左右的极化效应,CdTe检测器光电峰值的脉冲高度在几十分钟内降低了。在本文中,对CdTe检测器的特性进行了评估(在30℃和35℃),并研究了周期性偏置复位技术来稳定检测器性能。将具有0.5 s至60 s复位持续时间和1 min至20 min复位间隔的500 V偏压施加到1 mm厚的CdTe检测器上。发现0.5 s的复位持续时间和5 min的复位间隔能够使检测器的性能稳定在35℃。

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