Functional Verification of RTL Designs driven by Mutation Testing metrics

摘要

The level of confidence in a VHDL description directly depends on the quality of its verification. This quality can be evaluated by mutation-based test, but the improvement of this quality requires tremendous efforts. In this paper, we propose a new approach that both qualifies and improves the functional verification process. First, we qualify test cases thanks to the mutation testing metrics: faults are injected in the Design Under Verification (DUV) (making DUV''s mutants) to check the capacity of test cases to detect theses mutants. Then, a heuristic is used to automatically improve IPs validation data. Experimental results obtained on RTL descriptions from ITC''99 benchmark show how efficient is our approach.