Study on dielectric behavior of nano-Ag/polyacrylamide

摘要

Nano-Ag/polyacrylamide (PAM) composite can be prepared through radiation polymerization. The structure of the composite is determined by XRD and TEM. The composite is powdered to 45 /spl mu/m and then mixed with EVA evenly. The resistivity (/spl rho//sub v/), and breakdown electric-field intensity (E/sub b/) of this kind of EVA compound substance is measured at room temperature and at cryogenic temperature. The abnormal dielectric behavior of nano-Ag/PAM composite is discussed. The result shows that the resistivity and electric strength of EVA are improved apparently by adding nano-Ag.