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Effects of Trace Element Ag on Oxidation Failure of Copper Lead Frame

机译:微量元素银对铜引线框架氧化失效的影响

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The effects of trace element Ag on oxidation failure of copper lead frame were studied. It was found that trace Ag on surface has great effect on the oxidation failure of copper alloy lead frame. In dry condition, trace Ag on the surface increase its resistance of peeling. However, under hygrothermal aging, trace Ag on surface decrease its resistance of peeling. The oxide thickness, morphology and elements compositions were examined to see which one is the key factor leaded to peel of the oxide film. As a results, it become evident that Ag has the ability to block the diffusion of copper atoms, and consequently hold back the oxidation of copper, but the adhesive strength between copper and its oxide layer has little relation with oxide thickness and more important influence come from internal compressive stress which have great relations with initial structure of the copper lead frame
机译:研究了微量元素Ag对铜引线框架氧化破坏的影响。发现表面上的痕量银对铜合金引线框架的氧化破坏有很大的影响。在干燥条件下,表面上的痕量银会增加其抗剥离性。然而,在湿热老化下,表面上的痕量银降低了其耐剥离性。检查了氧化物的厚度,形态和元素组成,看哪一个是导致氧化膜剥离的关键因素。结果,很明显,Ag具有阻止铜原子扩散的能力,并因此阻止了铜的氧化,但是铜与其氧化物层之间的粘合强度与氧化物厚度几乎没有关系,并且产生了更重要的影响。内部压应力与铜引线框架的初始结构有很大关系

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