Parametric model order reduction for scanning electrochemical microscopy: fast simulation of cyclic voltammogram

摘要

We propose the use of parametric model reduction for fast simulation of cyclic voltammograms. The model for a cyclic voltammogram is treated as a system with a parameter (applied voltage) to be preserved during model reduction. The voltage is preserved in the symbolic form during model reduction and we can accurately simulate the cyclic voltammograms with a reduced system by spending much less time and memory as compared with direct simulation based on the original large-scale model.