IJTAG (internal JTAG): a step toward a DFT standard

摘要

The widespread use of the IEEE 1149.1 standard test access port as the interface for not only boundary scan but also for access to device-internal test features has led to a highly useful but highly fragmented opportunity for the test community. The need for a standard description of internal test features and protocols is elucidated, and the framework for the extension of the boundary scan standards as launched by the ad hoc IJTAG working group is described.