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Compensating differences between measurement and calibration wafer in probe-tip calibrations

机译：补偿探针尖端校准中测量晶片与校准晶片之间的差异

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《》|2002年|P.1837-1840|共4页
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Carchon; G.; De Raedt; W.; Beyne; E.;
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中图分类无线电电子学、电信技术;
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专利

1. Characterising differences between measurement and calibration wafer in probe-tip calibrations [J] . Carchon G., Nauwelaers B. Electronics Letters . 1999,第13期

机译：在探针尖端校准中表征测量晶圆和校准晶圆之间的差异
2. Optimal optical property calibration for wafer alignment using differences in wavelength eadings [J] . Research Disclosure . 2018,第648期

机译：利用波长衰减的差异对晶圆进行最佳光学性能校准
3. Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band [J] . International Journal of Microwave and Wireless Technologies . 2020,第5期

机译：基于砷化镓的GCPW校准套件的开发，用于W波段晶片上测量
4. Compensating differences between measurement and calibration wafer in probe-tip calibrations [C] . Geert Carchon, Walter De Raedt, Eric Beyne IEEE MTT-S International Microwave Symposium . 2002

机译：补偿探针校准中测量和校准晶片之间的差异
5. Radiochromic film dosimetry system: from calibration to in vivo measurements and IMRT quality assurance measurements. [D] . Delage, Patrick. 2011

机译：放射致变色膜剂量测定系统：从校准到体内测量以及IMRT质量保证测量。
6. A tutorial on calibration measurements and calibration models for clinical prediction models [O] . Yingxiang Huang, Wentao Li, Fima Macheret, 2020

机译：有关临床预测模型的校准测量和校准模型的教程
7. On-Wafer Calibration Techniques for Giga-Hertz CMOS Measurements [O] . Troels Emil Kolding 1999

机译：千兆赫CMOS测量的晶圆上校准技术
8. Variance of Measurements from a Calibration Function Derived from Data Which Exhibit Run-to-Run Differences [R] . Liebetrau, A. M. 1984

机译：来自显示运行差异的数据的校准函数的测量方差

Compensating differences between measurement and calibration wafer in probe-tip calibrations

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