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Temperature and voltage dependence of attenuated total reflection properties of liquid crystal molecules on the LB films

机译:LB膜上液晶分子的衰减全反射特性的温度和电压依赖性

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Behaviors of liquid crystal molecules, 5CB, have been investigated in the thick cells having aligning layers of the polyimide (PI) Langmuir-Blodgett (LB) films on the aluminum electrodes using the attenuated total reflection (ATR) measurement method. The ATR curves strongly depended upon the AC voltages applied to the cell and upon temperatures. The resonant excitations of the surface plasmon polariton (SPP) were observed in the broad region of the incident angle in the ATR measurements. The tilt angles of the liquid crystal molecules were calculated by fitting the theoretical ATR curves to the experimental ones. The results showed that the ATR measurement method was very useful for evaluating the behaviors of liquid crystal molecules in thick cells.
机译:已经研究了液晶分子,5CB的行为,在使用衰减的全反射(ATR)测量方法上在铝电极上对准聚酰亚胺(PI)朗米尔 - Blodgett(LB)膜的层的厚细胞中进行了研究。 ATR曲线强烈地依赖于施加到电池的AC电压和温度下。在ATR测量中的入射角的宽区域中观察到表面等离子体极谱(SPP)的共振激发。通过将理论ATR曲线拟合到实验组的倾斜角度来计算液晶分子的倾斜角度。结果表明,ATR测定方法非常有用,用于评估厚细胞中液晶分子的行为。

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