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High-power critical electron emission from dielectric induced by high-current-density electron beam injection and its transition to vacuum breakdown

机译:高电流密度电子束注入引起的电介质大功率临界电子发射及其向真空击穿的转变

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Since 1975, the authors' laboratory has been investigating the critical electron emission from dielectrics into vacuum with nanosecond time resolution using high-current-density electron accelerators. It allowed them to clear up some intrinsic properties of the critical electron emission induced by electron beam injection: (1) the emission pulse is delayed for several nanoseconds from the injection pulse; (2) the peak value of the emission current reaches 100-1000 A; (3) direct experimental evidence is obtained for intense electron-hole generation by superhigh electric field in subsurface layer of dielectric-this process is discovered to be the main reason of the transition to critical electron emission; (4) critical emission is not uniform and accompanied by point explosions on the dielectric surface and by injections of ion plasmas from these points into vacuum; and (5) transition of critical emission to vacuum breakdown has been observed.
机译:自1975年以来,作者的实验室一直在研究使用大电流密度电子加速器以纳秒级的时间分辨率从电介质向真空中发射临界电子。这使他们能够清除由电子束注入引起的临界电子发射的一些固有特性:(1)发射脉冲比注入脉冲延迟了几纳秒; (2)发射电流的峰值达到100-1000A; (3)获得了直接的实验证据,证明在电介质表层下的超高电场产生了强烈的电子空穴,这一过程被发现是转变为临界电子发射的主要原因。 (4)临界发射不均匀,并伴有电介质表面的点爆炸以及从这些点向真空中注入离子等离子体的现象; (5)观察到临界发射向真空击穿的过渡。

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