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Automation Of Memory Failure Analysis By Combining An Expert System With A Memory Tester/analyzer

机译：通过将专家系统与内存测试仪/分析仪结合使用，可以自动进行内存故障分析

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《》|2001年|P.283-286|共4页
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Hamada; H.; Tsujide; T.;
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中图分类无线电电子学、电信技术;
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专利

1. Failure Analysis of Memory Organization for Utilization in a Self-Repair Memory System [J] . Szygenda Stephen A., Flynn Michael J. Reliability, IEEE Transactions on . 1971,第2期

机译：用于自修复存储系统的存储组织的故障分析
2. Terahertz time-domain spectroscopy combined with fuzzy rule-building expert system and fuzzy optimal associative memory applied to diagnosis of cervical carcinoma [J] . Qi Na, Zhang Zhuoyong, Xiang Yuhong, Medical oncology . 2015,第1期

机译：太赫兹时域光谱结合模糊规则建立专家系统和模糊最优联想记忆技术在宫颈癌诊断中的应用
3. Comparative analysis of quality of service and memory usage for adaptive failure detectors in healthcare systems [J] . Naixue Xiong, Vasilakos A., Yang L., Selected Areas in Communications, IEEE Journal on . 2009,第4期

机译：医疗系统自适应故障检测器的服务质量和内存使用情况的比较分析
4. Automation Of Memory Failure Analysis By Combining An Expert System With A Memory Tester/analyzer [C] . Hamada H., Tsujide T., Institute of Electric and Electronic Engineer Japan International Electronic Manufacturing Technology Symposium . 2001

机译：通过将专家系统与内存测试仪/分析仪相结合来自动化内存故障分析
5. A model of information processing: An analysis of the influence of expertise and training on group performance, group efficacy, and transactive memory systems. [D] . Joerding, Jennifer Anne. 2003

机译：信息处理模型：分析专业知识和培训对团队绩效，团队效能和交互式记忆系统的影响。
6. Experts’ memory superiority for domain-specific random material generalizes across fields of expertise: A meta-analysis [O] . Giovanni Sala, Fernand Gobet -1

机译：专家对特定领域随机材料的记忆优势概括了各个专业领域：荟萃分析
7. Comparative Analysis of Quality of Service and Memory Usage for Adaptive Failure Detectors in Healthcare Systems [O] . Yi Pan, Rajgopal Kannan, Yingshu Li 2010

机译：医疗系统中自适应故障检测器的服务质量和内存使用对比分析
8. Memory Tester for the di/an Miniature Magnetic Core Memory System [R] . McGovern, T. L. 1964

机译：用于di / an微型磁芯存储系统的存储器测试仪

Automation Of Memory Failure Analysis By Combining An Expert System With A Memory Tester/analyzer

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