Reliability Of 1300-nm Spot-size Converted Lasers For Low-cost Optical Module Used In Fiber-To-The-Home

摘要

We first report the degradation mode of a spot-size converted (SSC) laser. We succeed in suppressing a buried heterointerface degradation with a combination of MOVPE growth and dry etching techniques (2-inch wafer process) . The far-field patterns and wide-temperature operation required for low-cost system application scarcely change during degradation, and the device life is beyond 10/sup 5/ hours at 60/spl deg/C, 10 mW.