A new method for the fault diagnosis of mixed digital and linear analog circuits is presented. The method is suitable for fault detection and location of large mixed digital and linear analog circuits. It can be applied for both combinational and sequential circuits but for sequential circuits the timing relationships between all analog- digital circuit ports must be taken into consideration such that the measurements at different ports must be taken at the proper timing. The fault diagnosis of the digital circuit is based on the test set generation. Therefore, all the works done concerning that topic can be applied here which is a major advantage of the developed method. The method presented can be used for the mixed analog-digital circuit test program development, prior to the availability of prototype. Illustrative examples are presented to clarify the developed method. Results are obtained and found consistent.
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