Faster time-to-market, lower cost of development and test for standard analog IC

摘要

This paper deals with one idea to minimize cost of development and test for standard analog IC. At the same time it gives an industrial approach to a method with the aim of optimizing the time-to-market of a whole family of products. This can be implemented without losing the product quality and with the opportunity of proceeding to a fast technical improvement of the family performances. The process methodology, based on array of devices on a single wafer is described. Particular emphasis is given to the design and test phases. A short comparison of virtual cycle time between a conventional standard analog IC and a product following the method is illustrated. An estimation of gain on a voltage references family development, in term of test resources, mask levels and time-to-market is given.