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Lifetime and spin relaxation time measurements of micro-fabricated GaAs tips

机译:微型GaAs尖端的寿命和自旋弛豫时间测量

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Circularly polarized light pumped GaAs tip is expected for application to a spin-polarized electron source, and, development of spin-polarized scanning tunneling microscope (SP-STM) using the GaAs tip has recently been attempted by some research groups. So far spin dependent tunneling current has been detected for the magnetic sample in SP-STM using the GaAs tip. However, there was very little information concerning to lifetime and spin relaxation time of electrons in the GaAs tips. In this study, time-resolved photoluminescence (TR-PL) from GaAs microtips was measured to evaluate lifetime and spin relaxation time.
机译:圆偏振光泵浦的GaAs尖端有望应用于自旋极化电子源,最近,一些研究小组已尝试使用GaAs尖端开发自旋极化扫描隧道显微镜(SP-STM)。到目前为止,已经使用GaAs尖端在SP-STM中检测到了磁性样品的自旋相关隧穿电流。但是,关于GaAs尖端中电子的寿命和自旋弛豫时间的信息很少。在这项研究中,测量了来自GaAs微尖端的时间分辨光致发光(TR-PL),以评估寿命和自旋弛豫时间。

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