Design of encoders and self-testing checkers for some systematic unidirectional error detecting codes

摘要

Several schemes for designing encoders and self-testing checkers (STCs) for systematic unidirectional error detecting (UED) codes are known. In this paper, we propose the new improved designs for encoders and STCs for some optimal systematic UED codes, which include the t-UED Bose-Lin codes, burst UED codes, and Berger codes. For I information bits, the new universal scheme employs a pair of multi-output threshold circuits with a total of I inputs. It is shown that for all codes considered the logic functions of an encoder (and hence an STC as well) can easily be derived. This new design approach reduces the hardware complexity for any systematic UED code with relatively small number of check bits.