首页> 外文会议> >X-ray induced partial discharge-an application for high voltage insulation diagnostics
【24h】

X-ray induced partial discharge-an application for high voltage insulation diagnostics

机译:X射线诱发的局部放电-高压绝缘诊断的应用

获取原文

摘要

The changes in discharge properties during irradiation forms the basis of X-ray induced PD (XIPD) location methods. By using an aperture arrangement to restrict and direct a beam of radiation during PD measurements, selected regions of the insulation can be systematically investigated. Large insulation systems can be tested with progressively restricted radiation sources to identify the regions responsible for the discharge. An example of this procedure is illustrated which relates to an XIPD test performed on a cylindrical insulator, rejected for exhibiting high PD levels. The insulation material in this case is epoxy resin impregnated paper.
机译:辐照过程中放电特性的变化形成了X射线诱导的PD(XIPD)定位方法的基础。通过在PD测量过程中使用孔径装置限制和引导辐射束,可以系统地研究绝缘体的选定区域。大型绝缘系统可以使用逐渐受限的辐射源进行测试,以识别造成放电的区域。举例说明了该程序的一个示例,该示例涉及在圆柱形绝缘子上执行的XIPD测试,该测试因表现出较高的PD水平而被拒绝。在这种情况下,绝缘材料是环氧树脂浸渍纸。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号