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Experiments in high current switching using small contact gaps

机译:使用小接触间隙进行大电流切换的实验

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A series of tests were performed on two types of commercial vacuum interrupters, herein called Type A and Type B to ascertain the effect of the contact gap on their high current interruption ability. The tests were carried out on a synthetic test plant at 12 kV, 31.5 kA for the Type A and 12 kV, 13.1 kA for the Type B, all values are rms. Three interrupters of each type were tested at contact gaps of between 8 mm and 1 mm. In addition, identical contacts were subjected to short circuit testing in a vacuum demountable chamber which allowed filming of the arc by means of a high speed camera. The results indicate that Type A showed a significant reduction in the probability of interruption of the rated short circuit current at contact gaps below 4 mm, whereas Type B showed no degradation at contact gaps down to 1 mm. The reasons for this are discussed.
机译:对两种类型的商用真空灭弧室(在此称为A型和B型)进行了一系列测试,以确定接触间隙对其高电流中断能力的影响。测试是在合成测试设备上进行的,其中A型为12 kV,31.5 kA,B型为12 kV,13.1 kA,所有值均为rms。测试了每种类型的三个灭弧室,其接触间隙在8毫米至1毫米之间。另外,在真空可拆卸的室内对相同的触点进行了短路测试,该短路允许通过高速摄像机拍摄电弧。结果表明,A型在低于4 mm的接触间隙处显着降低了额定短路电流的中断概率,而B型在低至1 mm的接触间隙处无退化现象。讨论了其原因。

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